Abstract

Here we report on the metal–semiconductor junction characteristics of a semiconducting ZnO nanowire grown directly on a metallic graphene film. The extracted specific contact resistivity of the graphene–ZnO nanowire contact (1.5 × 10−5 Ω·cm2) is comparable to that reported for Al–ZnO contacts. Based on the assumption that thermionic-field emission is the dominant mechanism, we obtained a zero-bias effective barrier height of 0.413 eV for the graphene–ZnO nanowire Schottky contact. We thus demonstrate that as a result of the enhanced tunneling at the contact, the graphene–nanowire contact exhibits near-ohmic current–voltage characteristics with a low contact resistance.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.