Abstract

One of the dominant trends in current research in materials science and related fields is the fabrication, characterization, and application of materials and device structures whose characteristic feature sizes are at or near the nanometer scale. Achieving an understanding of—and ultimately control over—the properties and behavior of a wide range of materials at the nanometer scale has therefore become a major theme in materials research. As our ability to synthesize materials and fabricate structures in this size regime improves, effective characterization of materials at the nanometer scale will continue to increase in importance.Central to this activity are the development and application of effective experimental techniques for performing characterization of structural, electronic, magnetic, optical, and other properties of materials with nanometer-scale spatial resolution. Two classes of experimental methods have proven to be particularly effective: scanning-probe techniques and electron microscopy. In this issue of MRS Bulletin, we have included eight articles that illustrate the elucidation of various aspects of nanometer-scale material properties using advanced scanningprobe or electron-microscopy techniques. Because the range of both experimental techniques and applications is extremely broad—and rapidly increasing—our intent is to provide several examples rather than a comprehensive treatment of this extremely active and rapidly growing field of research.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.