Abstract
Lanthanum doped lead titanate ferroelectric thin films were grown on Pt∕Ti∕SiO2∕Si(100) substrates using rf magnetron sputtering. X-ray diffraction patterns show that the main phase of the films is tetragonal perovskite with preferred orientation of (111) perpendicular to the substrate. We investigated the ferroelectric domain patterns and the corresponding polarization arrangements of the films using piezoresponse force microscopy. Head-to-tail polarization configurations were often found to exist, indicating that the low electrical energy configurations are quite common in these thin films. Nanoscale banded 90° a-a domain patterns as small as 30–60nm in width were observed. The banded domains alternated with adjacent lamellae can be attributed to mechanical strains at the surface and at the interface between the substrate and the film.
Published Version
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