Nanoscale analysis of the interface of dip layer/rubber in fiber/rubber composites

Abstract

The reaction mechanism and the interfacial modulus gradient of the interfacial transition layer between the environmentally friendly dipping system (PAL) and the rubber have not been fully studied. In order to better understand the chemical structures and nano-mechanical properties of the interface between the dip layer and the rubber, we used advanced atomic force microscope (AFM) and nanoscale Fourier transform infrared spectroscopy (nano-FTIR) to perform detailed analysis in this article. The characterization of interfacial nano-mechanical properties and chemical structures is very significant for the illustration of interfacial adhesion mechanism. AFM can effectively characterize the detailed interfacial modulus gradient and the thickness of interface, while nano-FTIR can comprehensively measure the interfacial chemical structures and the distribution of chemical bonds. The results suggest that the thickness of the interface between the PAL dip layer and the rubber matrix is 175 nm, and the crosslinking density of the interfacial layer is high, which explains that the failure location of fiber/rubber composites after pull-out tests occurs on the side of the rubber matrix. Similarly, the microstructure of resorcinol-formaldehyde-latex (RFL) system was also characterized, and the preparation of RFL usually requires carcinogenic and toxic substances such as formaldehyde and resorcinol.