Abstract
We present and describe an alternative device for positioning two massive optical elements at distances smaller than 1μm to each other. The developed technique is derived from the conventional nonoptical shear-force distance control usually used in scanning near-field optical microscopy (SNOM). It is suitable whatever the nature of the involved elements (metal, semiconductor, or dielectric) and is well adapted to solid immersion microscopy and virtual tip near-field microscopy.
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