Abstract

ABSTRACTThe effect of atomic hydrogen on the growth mode and surface morphology of GaAs(110) thin films grown by molecular beam epitaxy (H-MBE) has been studied for different kinetic regimes using atomic force microscopy (AFM). Growth in the Ga supply-limited regime after H-assisted oxide removal leads to the formation of multi-atomic step arrays by step bunching with a very uniform terrace size distribution in the 80 nm range. Growth under As-deficient conditions after H-assisted oxide removal induces a rapid self-organization of the GaAs(110) surface into a ridge pattern along the <001> tilt direction, which is broken down into a 3D mound morphology when H is also present during growth. A chacteristic nanofacetting of the surface with very straight <1–10> -type steps is observed at high temperatures regardless of atomic hydrogen being used during oxide desorption and/or epitaxial growth.

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