Nanoparticle Analyzing Technique Review and Sub-10 nm Nanoparticle Sizing Methods Comparison

Abstract

This paper provides a comprehensive review of current nanoparticle analysis methods specifically designed for sub-20 nm particles. The techniques are categorized into three main groups: ensemble (I), single particle counting (II), and separating & counting (III) methods. The study further presents a comparative analysis of test results obtained using these three categories of methods on polydisperse polymer nanoparticles. For this investigation, four different tools capable of sub-10 nm particle analysis were utilized. The techniques employed in this study include dynamic light scattering (I), atomic force microscope (II), scanning mobility liquid particle sizer (III), and cryo-electron microscopy (I). The findings indicate that, for particles larger than 8 nm, the three tools—excluding dynamic light diffraction—yield similar results. Conversely, in the small size range (<7 nm), cryo-electron microscopy consistently demonstrates reliable outcomes.