Abstract
A report, authored by Kim Carneiro at the Danish Institute of Fundamental Metrology, aims at identifying needs for R&D in metrology (both measurement and testing) to support the demands from nanotechnology. It was prepared for the High Level Expert Group (HLEG) on the generic activity ‘Measurement and Testing’ for the European Framework Programme for Research and Technology Development. In this, it is suggested that despite the multi-disciplinary nature of nanoscience and the multi-sector nature of its industrial applications, nanometrology can focus on a few generic developments, and the same measurement standards can support the three different industrial sectors: precision engineering, micro- and optoelectronics, as well as biomolecular technology.
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