Abstract
Based on atomic force microscopy (AFM), contact resonance AFM (CR-AFM) is a nondestructive technique that allows one to perform single point measurements as well as surface mapping of the indentation modulus of a material. In this work we exploit the possibility to use CR-AFM to study synthetic materials representative of K-basalt from Roman comagmatic Province. Having observed the presence of subsurface voids and inclusions at micrometer and sub-micrometer scale, a preliminary study has been conducted to verify the capability of CR-AFM nanomechanical mapping to nondestructively detect these features.
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