Abstract

This brief chapter provides an overview of nanomechanical cantilever (NMC) systems with their applications in cantilever-based imaging and manipulation platforms such as atomic force microscopy (AFM) and its varieties. Some new concepts in modeling these systems are also introduced along with practical applications in laser-free imaging and nanoscale manipulation and positioning. In an effort to keep this chapter focused, only a brief overview of these topics is presented in this chapter. Finally, the outlook in NMC-based imaging and manipulation is given.

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