Nanomagnetic logic: compact modeling of field-coupled computing devices for system investigations

Abstract

In this paper we investigate error rates of nanomagnetic logic devices with perpendicular magnetization by compact modeling. Two different types of nanomagnets for information propagation and logic computing are introduced. The switching behavior of field-coupled nanomagnets is measured and analyzed. A compact model is derived from physics and experimental results are applied to the magnetic compact model. General requirements for fabrication parameters and clocking fields for reliable operation are extracted. We perform simulations and measurements on single devices to demonstrate the accuracy of the macromodel. Simulations on complex systems show that the error rate of a field-coupled magnetic system strongly depends on the variation of the switching field and the strength of the coupling field between the nanomagnets. The error rate of a 1-bit full adder is investigated for varying dot parameters. The results demonstrate the importance of fast simulation tools for investigations on the design of nanomagnetic computing devices and systems.