Abstract
Changes in the nanohardness H and Young’s modulus E of GexAsySe100 − x − y films have been studied as a function of the penetration depth of the Berkovich indenter. The values of H and E have been measured in the regime of harmonic modulation of a linearly increasing indenter load. It has been shown that the changes in E and H of the films under study during nanoindentation arise due to the peculiarities of their elastoplastic behavior, the formation of deformation zones near the nanocontact, and also size effects.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
