Abstract
AbstractTo study the hydrogen storage materials in their thin film format provides a unique approach to investigate many interfacial phenomena associated with current research on hydrogen storage materials. However, the challenge is to establish a reliable method to measure weight change of at least a few tens of nanograms in pressurized hydrogen gas. We demonstrate the application of a quartz crystal microbalance for direct mass-metric evaluation of hydrogen storage materials in the pressure range of 0˜40 bars. The frequency shift of a quartz crystal coated with hydrogen absorbing materials is affected by the hydrogen mass uptake on the crystal, the pressure and the viscosity of the gases, and the crystal surface roughness, of which the roughness contribution has no direct analytical expression. Through a control experiment on the same crystal in helium, the roughness contribution in hydrogen can be derived and the frequency shift due to the hydrogen mass uptake is obtained.
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