Abstract
Samples of nanocrystalline Ni doped ZnO have been prepared and characterised by several techniques including chemical analysis, X-ray powder diffraction and X-ray absorption spectra (EXAFS). The particle sizes are typically less than 100Åon the largest diameter. The diffraction results show that lightly doped samples are single phase within the ZnO crystal structure. The EXAFS results indicate that the Ni2+ ions occupy some of the sites which would normally be occupied by Zn2+. Gas sensing experiments show a good response to low ppm concentrations of toluene vapour and a change in semiconductor type behaviour with temperature.
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