Abstract
High-strength polyethylene films containing 0.5-1.0 wt. % of nanocrystalline silicon (nc-Si) were synthesized. Samples of nc-Si with an average core diameter of 7-10 nm were produced by plasmochemical method and by laser-induced decomposition of monosilane. Spectral studies revealed almost complete (up to ~95 %) absorption of UV radiation in 200- 400 nm spectral region by 85 micron thick film if the nc-Si content approaches to 1.0 wt. %. The density function of particle size in the starting powders and polymer films containing immobilized silicon nanocrystallites were obtained using the modeling a complete profile of X-ray diffraction patterns, assuming spherical grains and the lognormal distribution. The results of X-ray analysis shown that the crystallite size distribution function remains almost unchanged and the crystallinity of the original polymer increases to about 10 % with the implantation of the initial nc-Si samples in the polymer matrix.
Highlights
In recent years, considerable efforts have been devoted to the search of new functional nanocomposite materials with unique properties that are lacking in their traditional analogues
The results of X-ray analysis shown that the crystallite size distribution function remains almost unchanged and the crystallinity of the original polymer increases to about 10 % with the implantation of the initial nanocrystalline silicon (nc-Si) samples in the polymer matrix
The structure of nc-Si obtained under different conditions and its aggregates, their adsorption and optical properties was studied in order to find ways of control the UV spectral characteristics of multiphase polymer composites containing nanocrystalline silicon
Summary
Considerable efforts have been devoted to the search of new functional nanocomposite materials with unique properties that are lacking in their traditional analogues. %. The density function of particle size in the starting powders and polymer films containing immobilized silicon nanocrystallites were obtained using the modeling a complete profile of X-ray diffraction patterns, assuming spherical grains and the lognormal distribution.
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