Abstract
AbstractThe prehistoric tools made by natural glass of obsidian can be dated by the recent method of the secondary ion mass spectrometry with the surface saturation using the surface saturation approach (SIMS‐SS). In its initial tests, the method inhered some limitations mainly derived from surface roughness. Indeed, the surface irregularities i.e. presence of wells, cracks, pits, crystals and/or crests, induce uncertain errors in the dating procedure. Here, we provide further images of the Atomic Force Microscopy (AFM) of obsidian surfaces and discuss the impact of AFM results on the SIMS‐SS dating, investigating the problematic non‐smoothed surfaces. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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