NaI(Tl) electron energy resolution

Abstract

NaI(Tl) electron energy resolution η e was measured using the Modified Compton Coincidence Technique (MCCT). The MCCT allowed detection of nearly monoenergetic internal electrons resulting from the scattering of incident 662 keV gamma rays within a primary NaI(Tl) detector. Scattered gamma rays were detected using a secondary HPGe detector in a coincidence mode. Measurements were carried out for electron energies ranging from 16 to 438 keV, by varying the scattering angle. Measured HPGe coincidence spectra were deconvolved to determine the scattered energy spectra from the NaI(Tl) detector. Subsequently, the NaI(Tl) electron energy spectra were determined by subtracting the energy of scattered spectra from the incident source energy (662 keV). Using chi-squared minimization, iterative deconvolution of the internal electron energy spectra from the measured NaI(Tl) spectra was then used to determine η e at the electron energy of interest. η e values determined using this technique represent variations in light production from monoenergetic electrons, light collection at the photomultiplier tube (PMT) photocathode, photoelectron production, photoelectron collection at the first dynode, and PMT gain, as well as noise from the accompanying electronics. It has been found that the electron energy resolution varies from 24.8% at 16 keV to 6.7% at 438 keV. Results from this study can be used to verify the significance of the different contributions to intrinsic energy resolution.