N-Heptyl xanthate adsorption on a ZnS layer synthesized on germanium: An in situ attenuated total reflection IR study

Abstract

Adsorption of n-heptyl xanthate on synthesized zinc sulfide was followed in situ by monitoring the methylene absorption band at 2925 cm −1. The zinc sulfide surface used in the adsorption experiments was synthesized on a germanium internal reflection element using the chemical bath deposition method. Characterization of the adsorbent surface was performed by X-ray photoelectron spectroscopy. The time needed to reach adsorption equilibrium varied with the initial concentration of the aqueous potassium heptyl xanthate solution. The amount of adsorbed xanthate ions increased with the concentration of the solution within the range studied (10 μM–50 mM). The experimental data are reasonably well described by the Langmuir adsorption isotherm. Polarized infrared attenuated total reflection (ATR) was used to determine the average orientation of the heptyl chains by measuring the absorbance of the infrared beam polarized perpendicularly and parallely to the plane of incidence. Measured absorbances were corrected for contribution from heptyl xanthate in bulk solution.