$n\hbox{-ZnO}/n\hbox{-GaAs}$ Heterostructured White Light-Emitting Diode: Nanoscale Interface Analysis and Electroluminescence Studies

Abstract

n-ZnO/n-GaAs heterostructured light-emitting diodes have been fabricated by a low-cost ultrasonic spray pyrolysis technique. Nanoscale interface analysis was carried out with scanning transmission electron microscopy. An ~ 8.6-nm-thick amorphous GaAsZnInO was found in the n -ZnO/n-GaAs interface. A strong and broad white electroluminescence band centered at ~ 525 nm and a weak near-infrared emission peaked at ~ 815 nm were observed when n-GaAs was positively biased. The 815-nm emission is believed to be related to the interface layer, and the 525-nm emission is assigned to the recombination of electrons from conduction band to deep-level holes in the ZnO layer.