Abstract
n-ZnO/n-GaAs heterostructured light-emitting diodes have been fabricated by a low-cost ultrasonic spray pyrolysis technique. Nanoscale interface analysis was carried out with scanning transmission electron microscopy. An ~ 8.6-nm-thick amorphous GaAsZnInO was found in the n -ZnO/n-GaAs interface. A strong and broad white electroluminescence band centered at ~ 525 nm and a weak near-infrared emission peaked at ~ 815 nm were observed when n-GaAs was positively biased. The 815-nm emission is believed to be related to the interface layer, and the 525-nm emission is assigned to the recombination of electrons from conduction band to deep-level holes in the ZnO layer.
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