Abstract
We present a spiral phase filtering system with a large tolerance for edge enhancement of both phase and amplitude objects in optical microscopy. The method is based on a Fourier 4-f spatial filtering system. A phase mismatched spiral phase plate (SPP) fabricated by electron beam lithography is employed as the radial Hilbert transform for image edge enhancement. Compared with holography, SPP is simple, economical, reliable, and easy to integrate.
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