Abstract
Electrical impedance tomography (EIT) is one of the cheapest ways in order to get a tomography. Principal purpose of the EIT is to obtain a conductivity distribution of a two-dimensional cross-sectional target area by injecting the current. EIT utilizes a functional relationship between the injection current and surface potential distribution depending on the conductivity difference. This functional relationship of EIT reveals that EIT has versatile possibilities but it is essentially reduced into solving for an ill-posed inverse problem. In order to develop the EIT, we try to apply the generalized vector sampled pattern matching (GVSPM) method to the inverse problem accompanying with EIT. As an initial test experiment of EIT development, we try to evaluate a resistance distribution in a planer circuit by measuring entire nodal voltages while changing the electrodes for current injection. As a result, it is revealed that a fairly good result could be obtained as an initial test example.
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