Abstract
X-ray elastic constants of two kinds of silicon nitride, gas-pressure sintered (EC141) and pressureless sintered (SN1), were experimentally determined for ten different diffractions by using Kα radiations of Cu, Co, Fe, Cr and V. For the stress measurement with high precision, 323 reflection by Cu-Kα1 radiation, 251 and 232 reflections by Fe-Kα radiation, and 411 reflection V-Kα radiation are recommended. The X-ray compliances, (1+ν)/E and ν/E (E=Young's modulus, ν=Poisson's ratio), change as a second power function of cos2φ (φ=angle between the diffraction plan normal and the c-axis of hexagonal crystal) for both kinds of silicon nitride.
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