ＩＰ式粉末Ｘ線回折像解析プログラム

Abstract

An x-ray powder diffraction technique with an imaging plate area detector is now widely used in various experimental fields including high pressure research. We developed a computer program named PIP capable of converting two-dimensional powder image to one-dimensional pattern. An aim of this program is to prepare easily, quickly, and user friendly one-dimensional diffraction patterns available for structure analysis such as Rietveld method. In this report, we answer some questions about PIP frequently asked by users.