Abstract
Noise-after-write has hen reported in thin-film heads, although the sources have not yet been identified. To discover these noise sources, I observed the manetic domain structum conversions after writing with an electron microscope, The magnetic domain observation consisted of lock-in image processing for back-scattered electron contraat (Type II), using a JEOL 2000FX II 200 kV electron microscope. Thin-film heads were excited with a 10 mAp-p, 100 kHz drive current. The magnetic domains in the upper yokes of the heads were obgerved after 60 mAp-p write operations. The head that had the highest noise probability of 5.2 × 10-2 exhibited radial walls oentered at the backgap closure because af stress. Its magnetic domain configuration after writing was severely converted. The head with the lowest noise probability of 1.6 × 10-4 exhibited a normal closure domain configuration, with very little conversion. These results indicate that noise-after-write is generated mainly near the backgap closure.
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