Muonium defect centers in semiconductors

Abstract

After a brief summary of the properties of the muonium defect centers observed in the elemental group IV semiconductors, the status of studies of muonium centers in semiconductors at the time of the last μSR conference in 1983 will be compared with what is currently known. With the introduction of new experimental techniques, such as high-transverse-field μSR and level-crossing spectroscopy, many new results are or soon will be available on muonium centers. These, combined with new theoretical studies, should lead to rapidly increased insight into a subject which has been both puzzling and resistant to clarification.