Muon capture through bonding electrons in pure silicon.

Abstract

The muonic x-ray intensities of the Lyman series in pure silicon are investigated. The fitted data are compatible with a statistical initial angular momentum distribution of the captured muons. From a comparison with data measured in diamond, cubic boron nitride and in the two isoelectronic series ${\mathrm{F}}^{\mathrm{\ensuremath{-}}}$,Ne,${\mathrm{Na}}^{+}$ and ${\mathrm{Cl}}^{\mathrm{\ensuremath{-}}}$,Ar,${\mathrm{K}}^{+}$, we conclude that the calculated muon distribution reflects the symmetry of the electrons through which muon capture proceeds.