Abstract
A multiwalled carbon nanotube (MWNT) probe was used as a scanning probe in an atomic force microscope (AFM) to obtain surface height maps of micro/nano structures. The surface height maps acquired by the MWNT probe are compared with those by a conventional silicon probe on the four samples: silicon ruler, polymer microchannels, silicon nanomembrane and nanocomposite metal particle (MP) tapes. The results of the silicon ruler, microchannels and membrane samples show that the surface height maps by the MWNT probe have a better resolution than those by a conventional silicon tip due to the sharper tip with the larger aspect ratio of the MWNT. A MWNT probe is especially useful to observe surface height maps of the structures that have larger aspect ratio.
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