Abstract
This paper investigates the influence of multiscale roughness in predicting scattering and emission. For the purpose of numerical simulation, we adopt a modulation concept to model the multiscale roughness. By varying the modulation index, we are able to accommodate the degree of scales. The results indicated that the backscattering coefficient peak moves to a larger incident angle because the modulation effect changes the local incidence. The emissivity is more sensitive to the degree of scales at small to moderate look angles. The emissivity is underestimated at a small to moderate look angle region if the multiscale effect is ignored in the modeling. The polarization difference of emissivity reduces with more fine scales of roughness and decreases with sensor frequency. This study suggested that the modulated correlation function is applicable to better model the multiscale rough surface in the practice of microwave scattering and emission. More simulations and conclusions will be presented at the conference.
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