Abstract
With only simple modifications, standard rf ion sources can be used in single-ended accelerators to produce useful currents of argon beams of charge up to + 5. If the ion source bottle is dirty from previous use, multiply-charged ion beams of the contaminants are also observed in useful quantities with pure argon as the source gas, although they may interfere with control of the machine on the argon beams.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
