Abstract
A multiple-wavelength resonant fluctuation x-ray scattering approach is proposed for element-specific imaging of nanoscale objects in random ensembles with short positional and rotational relaxation times. It is shown, that by applying x-ray cross-correlation analysis in combination with iterative phase retrieval to the scattering data measured at multiple x-ray energies near an absorption edge of a substance, it is possible to image the nanoscale structure of an individual object with chemical sensitivity. The elemental distribution in distinct two-component model nanostructures was reconstructed using the simulated scattering data from two-dimensional random ensembles of particles. The approach might be especially advantageous for structural studies at x-ray free electron lasers.
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