Abstract
Abstract The Kirchhoff double-scatter method for calculating the intensity distribution scattered from a rough surface is extended to dielectric and metal surface materials. The material properties are contained in the Fresnel reflection coefficients only. It is shown that the results agree well with calculations using the exact method for a surface of Gaussian statistics with standard deviation of height σ = 1·93λ and 1/e correlation length τ = 5·02λ.
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