Abstract
Yttrium aluminum garnet (YAG) crystals are one of the most important materials for active media in solid-state laser technology. Reach for higher energies brings more stress into crystals thin film coatings field, where methods used in the past are not sufficient anymore. Laser induced damage threshold (LIDT) became a major issue in further exploitation of YAG crystals as required extraction fluencies exceed tens J·cm-2 in nanosecond regime. Consequently, improved coating techniques based on e-beam deposition were introduced in order to improve damage resistance of active media. Thin films prepared on YAG crystals either by reactive or ion-assisted e-beam deposition technique were tested on LIDT by son- 1 method according to the ISO standards recommendations and results are presented in following paper.
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