Abstract
Abstract : The invention of atomic force microscope (AFM) by Binnig and his co-workers (Binnig et al., 1986) has led to the imaging of conducting and insulating surfaces with nanometer scale resolution. The AFM measures very small forces (less than nN) between a cantilever-tip and the sample surface. When the tip is brought near the surface, the interaction forces between the tip and the sample cause the cantilever to deflect. A topographic image of the surface is obtained by raster scanning the tip across the sample surface and using the interaction force as a parameter for a feedback electronics system which maintains the force at a constant set value. Since the invention of the AFM, it has become a popular tool for surface characterization and is now routinely used in many industries and academic research labs with applications in several research areas.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.