Abstract
A method for increasing the sensitivity of measurements through aberration compensation upon reconstruction of interferograms from two multiple-exposure holograms is proposed. At the early stage of object investigation, the holographic structures recorded at certain time instants are rerecorded by two coherent beams on new image carriers. In this case, the interference moire method is employed to monitor the equality of the vectors of the holographic structures rerecorded. At the final stage, the new nonlinear holograms are processed in an optical analyzer of conjugate holograms with the use of incoherent light. The hologram thus reconstructed offers a high sensitivity of measurements and is free of aberrations. The method is tested by visualizing the temperature-field variations in a glass substrate with a conducting coating.
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