Multiple Deferred State Sampling Plan for Exponentiated New Weibull Pareto Distributed Mean Life Assurance

Abstract

Abstract This article proposes a methodology of designing the multiple deferred state acceptance sampling plan for assuring lifetime of the products when the underlying distribution of lifetime is exponentiated new Weibull-Pareto. Inspection of the sample items is done based on attribute quality characteristics under a time truncated life test. A number of tables are constructed using attribute multiple deferred state acceptance sampling plans of some specified value for mean lifetime ratio that may be obtained under the exponentiated new Weibull-Pareto model. The consequence of misspecification of the shape parameter and the role of the number of successive lots needed for sentencing current lot are investigated. A procedure for implementing the proposed plan for life-testing applications is included. The performance of the proposed plan is compared in terms of the average sample number required as well as discriminating power.