Multiple chain-deferred inspection plans and their compatibility with the multiple plans in MIL-STD-105D and equivalent schemes

Abstract

This paper proposes a multiple sample extension of the chain-deferred plans by the author (1983). These plans are similar to the traditional multiple plans except that they use information from, at most, four surrounding lots when sentencing the current lot. When compared with existing plans, the new proposals either reduce the cost of the decision procedure or reduce the possible length of the queue of unsentenced lots and at the same time give an equivalent overall protection. The average sample number before a decision and the average delay time are both examined and compared with existing multiple deferred state sampling plans and with the traditional multiple plans. The compatibility of these plans with the traditional multiple plans is illustrated.