Multiphysics Analysis of Pin-Socket Electrical Dynamic Contact Susceptibility Under Vibration Stress

Abstract

The pin-socket connector susceptibility under vibration stress constitutes one of the electrical engineer breakthroughs. Only single electrical engineering is not enough to treat this challenging issue. The Multiphysics analysis is expected to be a solution to analyze this electromechanical dynamic pin-socket structure. This paper develops a dynamic contact Multiphysics analysis with the tensorial analysis of networks (TAN) formalism. The Multiphysics model integrates the pin relative velocity and position coupled with the instantaneous contact resistance implemented in an RC -network. An innovative method enabling to determine the vibration stress signature via the signal-to-noise (SNR) amplitude is established. The relevance of the Multiphysics TAN model is illustrated with an example of a 10-mm-length pin-socket under arbitrary waveform uniaxial vibration stress with 20-kHz bandwidth. It was shown that the contact resistance may fluctuate with more than thousand-time relative variation. More importantly, the vibration stressed pin-socket SNR in function of the RC -network parameters is discussed. The proposed Multiphysics analysis can be potentially applied to the electromagnetic compatibility and signal integrity investigation of assembled electronic equipment and printed circuit boards under vibration stress.