Abstract

This study focuses on multimodal artifact metrics and proposes a technique based on multimodal biometric systems that are a type of biometric identification systems. It is expected that this technique can aid in verifying the authenticity of each artifact in a more accurate manner and in increasing the level of difficulty involved in counterfeiting when compared to those of existing artifact metric techniques. This technique will ensure that artifacts will possess specific characteristics (two or more) that are extracted from different physical characteristics. The study created card-shaped samples with two physical characteristics (electrical and optical characteristics) to prove the feasibility of the proposed technique. The results indicate that two information features, namely sheet resistance and visible light image, which are extracted from the above characteristics, are different in each sample. This indicates that the two information features can correspond to the characteristic information necessary to distinguish each sample.

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