Abstract
The multilayer structure on a piezoelectric delay line has been examined for a metallic glass of composition Fe76B22Si2. An amorphous film configuration which consisted of 1, 2, 3, 6 or 9 layers of metallic glass, insulated by 2 nm silicon films, has been designed and experimentally verified in a variable delay line. The results for a one-layer film compared with a three-layer configuration suggest that the multilayer structure of metallic glass ensures a lower magnetic field value than does the one-layer film (for the same thickness of magnetic medium).
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