Abstract
Low-energy electron diffraction (LEED) I– V has been utilized to determine the surface structure of Cu(2 1 0). The surface structure is found to exhibit multilayer relaxation following the trend − − + (− is contraction and + is expansion in the interlayer spacing). The magnitude of interplanar relaxation is found to be damped, where | Δd 12|>| Δd 23|>| Δd 34|, etc. This kind of behavior is quite different from that observed on Al(2 1 0) [Phys. Rev. B 38 (1988) 7913], where the magnitude of interplanar relaxation in the third interlayer is larger than that in the second interlayer (i.e., | Δd 23|<| Δd 34|). The difference of damped multilayer relaxation behavior of Cu(2 1 0) and Al(2 1 0) could be related to a charge density oscillation perpendicular to the surface.
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