Multilayer material characterization using thermographic signal reconstruction

Abstract

Active-thermography has become a well-established Nondestructive Testing (NDT) method for detection of subsurface flaws. In its simplest form, flaw detection is based on visual identification of contrast between a flaw and local intact regions in an IR image sequence of the surface temperature as the sample responds to thermal stimulation. However, additional information and insight can be obtained from the sequence, even in the absence of a flaw, through analysis of the logarithmic derivatives of individual pixel time histories using the Thermographic Signal Reconstruction (TSR) method. For example, the response of a flaw-free multilayer sample to thermal stimulation can be viewed as a simple transition between the responses of infinitely thick samples of the individual constituent layers over the lifetime of the thermal diffusion process. The transition is represented compactly and uniquely by the logarithmic derivatives, based on the ratio of thermal effusivities of the layers. A spectrum of derivative responses relative to thermal effusivity ratios allows prediction of the time scale and detectability of the interface, and measurement of the thermophysical properties of one layer if the properties of the other are known. A similar transition between steady diffusion states occurs for flat bottom holes, based on the hole aspect ratio.