Abstract

Multilayer InAs quantum dot with a thin spacer prepared using a GaNAs strain compensation layer was investigated by metalorganic chemical vapor deposition. The GaNAs tensile strained layer was inserted partly in the spacer without contacting with the compressively strained InAs dot and GaInAs cover layer. The stacking number of up to 5 with a thin spacer of 18 nm was realized at a wavelength of 1.4 µm without severe degradation of optical quality although a slight dot size increase in the upper layer was confirmed. The result indicates the advantageousness of GaNAs for a thin spacer structure of the multilayer quantum dot.

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