Abstract
Multilayer thin films of metallic glasses of FeBSi/Si/FeBSi alloys have been investigated by means of the ferromagnetic resonance technique. Here we measure the resonance at the x-band and in a magnetic field rotating from perpendicular orientation to the parallel case.FeBSi layers were from L=200 to 1500 Å thick. The thickness t of the intermediate Si film varied in the range from 5 to 30 Å. Samples were obtained by the rf sputteringtechnique. The saturation magnetization M s and g-factor were calculated from resonance positions in perpendicular and parallel cases. For t below 20 Å and L less than 500 Å, typical single film spectra are observed as for films with thickness equal to the total thickness of multilayer samples. For the same range of t and L > 500Å there are some inhomogeneities of M s seen in the perpendicular resonance; we estimate the magnetization profile near interfaces for Δ M s=40gG. The observed linewidth of 200 to 260 G in parallel geometry is too large for inhomogeneities of M s to manifest their presence in this case. Samples with thickness t larger than 20 Å of Si show a lack of the magnetic coupling and the spectra are just a superposition of roughly independent contributions from separate FeBSi layers.
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