Abstract
Abstract A new type of multilayer interference structures for X-ray optics consisting of alternating carbon layers with different parameters is proposed. The properties of carbon films and multilayer carbon structures were investigated by X-ray diffraction measurements. The numerical computations of reflecting ability of multilayer carbon structures with an ideally smooth interface and with roughness of the individual layers were carried out. It was found that intensity of the calculated first Bragg peak was much too high compared with the experiment. That is the consequence of both the interface roughness and the random fluctuation in layer thicknesses.
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