Abstract

A MDM (Metal Dielectric Metal) waveguide which is having slotted structure has been studied thoroughly to identify the propagation of surface Plasmon. With the addition of high refractive index material i.e. silicon, The MDM waveguide is analyzed to identify better sensitivity and reflectance. The sensitivity and reflectance of MDM waveguide against the variation of refractive index have been identified with the help of FDTD (Finite Differential Time Domain) method. This geometry not only exhibit high index sensitivity (≈ 19000 nm-RIU−1) but also shows higher transmission (≈ 10 %). Further, we have also investigated the geometry with different dielectric materials (Air, Silicon-di-Oxide). The transmission acquired is of the order Ag — Si — Air — Ag > Ag — Si — Ag> Ag — Si — SiO 2 — Ag for slot MDM structures.

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