Multi-Instrument Manager Tool for Data Acquisition and Merging of Optical and Electrical Mobility Size Distributions

Abstract

Electrical mobility classification (EC) followed by Condensation Particle Counter (CPC) detection is the technique combined in Scanning Mobility Particle Sizers(SMPS) to retrieve nanoparticle size distributions in the range from 2.5 nm to 1 μm. The detectable size range of SMPS systems can be extended by the addition of an Optical Particle Sizer(OPS) that covers larger sizes from 300 nm to 10 μm. This optical sizing method reports an optical equivalent diameter, which is often different from the electrical mobility diameter measured by the standard SMPS technique. Multi-Instrument Manager (MIMTM) software developed by TSI incorporates algorithms that facilitate merging SMPS data sets with data based on optical equivalent diameter to compile single, wide-range size distributions. Here we present MIM 2.0, the next-generation of the data merging tool that offers many advanced features for data merging and post-processing. MIM 2.0 allows direct data acquisition with OPS and NanoScan SMPS instruments to retrieve real-time particle size distributions from 10 nm to 10 μm, which we show in a case study at a fireplace. The merged data can be adjusted using one of the merging options, which automatically determines an overall aerosol effective refractive index. As a result an indirect and average characterization of aerosol optical and shape properties is possible. The merging tool allows several pre-settings, data averaging and adjustments, as well as the export of data sets and fitted graphs. MIM 2.0 also features several post-processing options for SMPS data and differences can be visualized in a multi-peak sample over a narrow size range.