Abstract
Temperature sensitive thick films based on spinel-type NiMn2O4-CuMn2O4-MnCo2O4 manganites with p- and p+-types of electrical conductivity and their multilayer p+-p structures were studied. These thick-film elements possess good electrophysical characteristics before and after long-term ageing test at 170 °C. It is shown that degradation processes connected with diffusion of metallic Ag into film grain boundaries occur in one-layer p-and p+-conductive films. Some part of the p+-p structures were of high stability, the relative electrical drift being no more than 1 %.
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