Abstract
Multifractal (MF) analysis of space forms on the surfaces of thin layers of Zn x Cd1 − x Te solid solution precipitated onto a Si(111) substrate via the hot wall approach is performed. AFM images of film surfaces are used for MF analysis. The parameters of MF spectra are determined for the film surfaces of the above system. It is shown that the MF functions of system correspond to their canonical forms, and the resulting computational procedure can be applied to describe and analyze the state of spatial fractal structures that form on a layer’s surface. The quantitative relationships between the parameters of the MF spectrum of a film’s surface and its conditions of precipitation are revealed.
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