Abstract

Fringe projection profilometry plays an important role for quality control in production line. However, it is facing challenges in the measurement of objects with intricate structures and high dynamic range that involved in precision manufacturing and semiconductor packaging. In this paper, a multi-view fringe projection profilometry system, which deploys a vertical telecentric projector and four oblique tilt-shift cameras, is presented to address the “blind spots” caused by shadowing, occlusion and local specular reflection. A flexible and accurate system calibration method is proposed, in which the corrected pinhole imaging model is used to calibrate the telecentric projection, and the unified calibration is performed by bundle adjustment. Experimental results show that the 3D repeated measurement error and standard deviation are no more than 10 μm within a measurable volume of 70 × 40 × 20 mm3. Furthermore, a group of experiments prove that the developed system can achieve complete and accurate 3D measurement for high dynamic range surfaces with complex structures.

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