Multi-physics coupling test design and failure analysis of intelligent door lock

Abstract

In this paper, the multi-physical field coupling test of the intelligent door lock is firstly designed based on the actual service scenario of the product. The failure analysis of the display circuit is implemented after the multi-physical field coupling reliability test. The failure reasons and mechanism of the intelligent door lock abnormal-display widely existing in the market are proved and reproduced. The research shows that there are two main reasons for the abnormal display in the market at present. First, the mechanical cracking of the outer bonding point of the LED on the display panel leads to the failure of the LED, which in turn leads to an abnormal-display for the intelligent door lock. Second, improper three-defense technology of the display circuit system leads to sulfide corrosion failure of the silver layer of the resistance surface electrode, and the resistance of the circuit system increases or opens failure, which makes the intelligent door not display in service.